The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Apr. 03, 2006
Hyeung-yun Kim, Palo Alto, CA (US);
Hyeung-Yun Kim, Palo Alto, CA (US);
Advanced Structure Monitoring, Inc., Cupertino, CA (US);
Abstract
Interrogation systems for monitoring structural health conditions. An interrogation system includes at least one wave generator for generating a wave signal and optical fiber sensors applied to a structure. The interrogation system also includes at least one electronic module for generating an input sensor signal and sending the input sensor signal to the optical fiber sensors. Each optical fiber sensor impresses the wave signal onto the input sensor signal to generate an output sensor signal that is frequency shifted from the input sensor signal. The electronic module generates an information signal in response to the output sensor signal. The interrogation system also includes a signal processing unit and a relay switch array module that has relay switches. Each relay switch relays the information signal to the signal processing unit and the signal processing unit generates a digital sensor signal that is subsequently sent to a computer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile