The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
May. 24, 2004
Uri Maoz, Rehovot, IL;
Amos Noy, Jerusalem, IL;
Cadence Design (Israel) II Ltd., Rosh Ha'ayin, IL;
Abstract
A method and system for managing test generation and examination of test coverage so as to most efficiently obtain maximum coverage during test generation. Therefore, in addition to achieving coverage maximization, the present invention also preferably manages test generation in order to increase the efficiency of testing to obtain such coverage maximization. The present invention also preferably provides tactics and/or strategies for generation as part of such management. Thus, coverage providing by test generation and execution is not only measured, but is also preferably obtained in a more efficient manner by enabling the coverage maximization functions to provide feedback and management to the test generation process.