The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Apr. 08, 2004
Masaki Shioya, Tokyo, JP;
Noriyasu Sagara, Tokyo, JP;
Yuji Tsubota, Tokyo, JP;
Kajima Corporation, Tokyo, JP;
Abstract
A facility control monitor method and a facility control monitor apparatus capable of visually tracing a control logic and easily finding a cause of an operation trouble caused by the control logic. The facility control monitor method monitors control performed by a control device included in a facility having a controllable device, the control device for controlling the controllable device, a setting device for transmitting a setting control value to the control device, and a sensor for transmitting an operation state measurement value of the controllable device to the control device. Processes of control performed by the control device are stored. When an arbitrary date and time is specified by a trace controller (), predetermined control steps of the specified date and time and after are displayed in a flowchart on a control flow display unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile