The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Jul. 22, 2003
Xiaoli BI, Cerritos, CA (US);
Joon Shim, Fremont, CA (US);
Compumed, Inc., Los Angeles, CA (US);
Abstract
A method, machine-readable storage medium embodying computer-readable code and automated system for assaying or monitoring the extent of joint or bone deformity reported by a summarized score that may include joint space narrowing, bone erosion and periarticular osteoporosis in a joint-degenerative or joint-damaging disease in a subject are disclosed. From a digitized image of one of the subject's straight bone terminated with a joint such as fingers, coordinates of right and left bone contours of a selected middle or proximal phalange are determined, and these coordinates are in turn used to determine the coordinates of a minimum width in the middle region of the phalange and one or more apices in a region adjacent at least one side of a joint of the selected phalange. These latter coordinates are used in selecting a reference joint contour representing normal-bone contour for that phalange, or the contour of the patient phalange from an earlier x-ray image. Guided by the reference joint contour, a region of the selected joint of the patient is analyzed to assay or monitor the extent of joint or bone deformity in the subject.