The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2007

Filed:

Mar. 04, 2003
Applicants:

Hideo Yokota, Wako, JP;

Sakiko Nakamura, Wako, JP;

Atsushi Yoshiki, Wako, JP;

Akitake Makinouchi, Wako, JP;

Ryutaro Himeno, Wako, JP;

Toshiro Higuchi, Wako, JP;

Inventors:

Hideo Yokota, Wako, JP;

Sakiko Nakamura, Wako, JP;

Atsushi Yoshiki, Wako, JP;

Akitake Makinouchi, Wako, JP;

Ryutaro Himeno, Wako, JP;

Toshiro Higuchi, Wako, JP;

Assignee:

Riken, Saitama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to make observation of localizations of in vivo expressed genes possible in an entire individual living organism such as animals, and plants, a living genetic recombinant specimen containing a marker that can be detected at the time when specific genes are expressed is sequentially severed, sectional images each of which corresponds to an image of sections severed are photographed in every scissions of the living specimen, and three-dimensional observation of the living specimen is implemented on the basis of the images photographed in every scissions described above, whereby three-dimensional localizations of expressed genes are observed in the living specimen.


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