The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Apr. 01, 2004
Bruno Kristiaan Bernard DE Man, Clifton Park, NY (US);
Samit Kumar Basu, Niskayuna, NY (US);
Peter Michael Edic, Albany, NY (US);
Robert Franklin Senzig, Germantown, WI (US);
William Robert Ross, Scotia, NY (US);
Xiaoye Wu, Rexford, NY (US);
Colin Richard Wilson, Niskayuna, NY (US);
Mark Ernest Vermilyea, Niskayuna, NY (US);
Eugene Lino Saragnese, Delafield, WI (US);
Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);
Samit Kumar Basu, Niskayuna, NY (US);
Peter Michael Edic, Albany, NY (US);
Robert Franklin Senzig, Germantown, WI (US);
William Robert Ross, Scotia, NY (US);
Xiaoye Wu, Rexford, NY (US);
Colin Richard Wilson, Niskayuna, NY (US);
Mark Ernest Vermilyea, Niskayuna, NY (US);
Eugene Lino Saragnese, Delafield, WI (US);
General Electric Company, Niskayuna, NY (US);
Abstract
Configurations for stationary imaging systems are provided. The configurations may include combinations of various types of distributed sources of X-ray radiation, which generally include addressable emitter elements which may be triggered for emission in desired sequences and combinations. The sources may be ring-like, partial ring-like, or line-like (typically along a Z-axis), and so forth. Combinations of these are envisaged. Corresponding detectors may also be full ring detectors or partial ring detectors associated with the sources to provide sufficient coverage of imaging volumes and to provide the desired mathematical completeness of the collected data.