The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2007

Filed:

Mar. 25, 2005
Applicants:

Dejun Wang, Beijing, CN;

Jiali Zhao, Beijing, CN;

Seokcheol Kee, Gyeonggi-do, KR;

Inventors:

Dejun Wang, Beijing, CN;

Jiali Zhao, Beijing, CN;

Seokcheol Kee, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/80 (2006.01);
U.S. Cl.
CPC ...
Abstract

A global localization apparatus, medium, and method, with the global localization method including selecting one from a plurality of samples and shifting the selected sample according to a movement of a robot, generating a new sample within a predetermined range of the shifted sample, determining either the shifted sample or the new sample as a next sample at a next time step according to a predetermined condition for the shifted sample and the next sample, repeating for all the samples, and estimating a next position of the robot according to positions of the next samples when the number of next samples is equal to or larger than the maximum number of samples.


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