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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7280227 B1

PDFFull Text
Expired
Date of Patent:
Oct. 09, 2007

Filed:

Dec. 14, 2005

Device, method and system for measuring the distribution of selected properties in a material

Applicants:

Harald Merkel, Källered, SE;

Mikael Reimers, Västra Frölunda, SE;

Inventors:

Harald Merkel, Källered, SE;

Mikael Reimers, Västra Frölunda, SE;

Assignees:

Merkel Physik, Kallered, SE;

Mikael Reimers, Vastra Frolunda, SE;

Attorney:

Birch, Stewart, Kolasch & Birch, LLP

Primary Examiner:

Gregory J Toatley, Jr

Assistant Examiner:

Gordon J Stock, Jr

Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/30 (2006.01); G01N 21/00 (2006.01); G01N 9/24 (2006.01); G01N 29/00 (2006.01); G01N 29/04 (2006.01); G01N 21/86 (2006.01); G06K 9/00 (2006.01); G01V 8/00 (2006.01); G01R 27/32 (2006.01); G01R 27/04 (2006.01); G06M 7/00 (2006.01); H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for measuring a distribution of selected properties of a material. The device includes an emitter configured to emit electromagnetic radiation at at least a first and second frequency in a selected frequency range through the material, at least one sensor configured to detect electromagnetic radiation transmitted through the material, and an analyzer configured to determine the distribution of selected properties based on the detected electromagnetic radiation at the at least first and second frequency. Further, the distribution of the selected properties is unchanged between the emitted electromagnetic radiation at the first and second frequencies.

Find Patent Forward Citations

Merkel, Harald. (2007). Device, method and system for measuring the distribution of selected properties in a material (U.S. Patent No. 7280227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7280227

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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