The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Sep. 18, 2002
Seiichiro Kinugasa, Tokyo, JP;
Keiji Miyazawa, Tokyo, JP;
Takaaki Kuroiwa, Tokyo, JP;
Yamatake Corporation, Tokyo, JP;
Abstract
Light emitted by a light source is inputted to a sensor to generate an optical path difference on input light according to a physical parameter to be measured, light outputted with an optical path difference generated in response to the input is inputted to another sensor to generate an optical path difference on input light according to a physical parameter to be measured, and light outputted with an optical path difference generated in response to the input is split into two to generate an interference fringe. Due to the presence of light which is changed in optical path length in the first sensor, is inputted to the sensor of the subsequent stage, and is transmitted without being changed in optical path length, and light which is not changed in optical path length in the first sensor, is inputted to the sensor of the subsequent stage, and is transmitted after being changed in optical path length, an interference fringe is generated with an fringe located on a position corresponding to a difference value between physical parameters to be measured. Thus, a difference value between physical parameters is measured by detecting the position.