The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2007

Filed:

Jul. 29, 2005
Applicants:

Harald Schmuck, Schwieberdingen, DE;

Heinz-georg Krimmel, Korntal-Münchingen, DE;

Inventors:

Harald Schmuck, Schwieberdingen, DE;

Heinz-Georg Krimmel, Korntal-Münchingen, DE;

Assignee:

Alcatel, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for the reflectometric testing of an optical transmission line from an optical transmission and reception device, in which a test signal is fed into the transmission line from the direction of the optical transmission and reception device and the signal reflected back to the optical transmission and reception device is analysed, in which the transmission device provided for transmitting the useful signal is also used as the transmitter of the test signal by switching it from transmission mode to test mode, and the transmission device itself is used as the receiver of the reflected signal, as well as to an optical device and to an optical transmission and reception device therefore.


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