The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2007

Filed:

Jul. 01, 2004
Applicants:

Rune Wendelbo, Oslo, NO;

Duncan E. Akporiaye, Oslo, NO;

Arne Karlsson, Oslo, NO;

Ib-rune Johansen, Oslo, NO;

Ivar M. Dahl, Oslo, NO;

Britta G. Fismen, Oslo, NO;

Richard Blom, Oslo, NO;

Dag T. Wang, Oslo, NO;

Morten Gulliksen, Oslo, NO;

Martin Plassen, Oslo, NO;

Inventors:

Rune Wendelbo, Oslo, NO;

Duncan E. Akporiaye, Oslo, NO;

Arne Karlsson, Oslo, NO;

Ib-Rune Johansen, Oslo, NO;

Ivar M. Dahl, Oslo, NO;

Britta G. Fismen, Oslo, NO;

Richard Blom, Oslo, NO;

Dag T. Wang, Oslo, NO;

Morten Gulliksen, Oslo, NO;

Martin Plassen, Oslo, NO;

Assignee:

UOP LLC, Des Plaines, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01G 21/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention comprises an apparatus and a method for mass analyses of an array of samples contained in distinct sample holders. The sample holders are placed on a plurality of sensors which preferably comprise an array of microbalances providing output signals comprising mass data on the array of samples.


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