The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Oct. 04, 2005
Applicants:
Marvin Klein, Pacific Palisades, CA (US);
Todd Sienicki, Los Angeles, CA (US);
Jerome Eichenbergeer, Los Angeles, CA (US);
Inventors:
Marvin Klein, Pacific Palisades, CA (US);
Todd Sienicki, Los Angeles, CA (US);
Jerome Eichenbergeer, Los Angeles, CA (US);
Assignee:
Op tech Ventures LLC, Torrance, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
Subsurface defects in a processed metal are detected by a laser-ultrasonic method involving generation of a surface acoustic wave at one location on the processed metal surface, and detection of a scattered acoustic wave at another location on the processed metal surface. The method can be used in-line to provide real time monitoring of laser cladding and other metal processing operations.