The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Jun. 11, 2003
Jacek A. Czerwonka, Redmond, WA (US);
Jacek A. Czerwonka, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Provided is a system and method comprising a test suite generation mechanism for testing a domain (e.g., software program) via 'black-box' testing. Parameters are defined, appropriate values for each are chosen, and via the system and method a suite of test cases are automatically generated that covers all N-way parameter combinations (e.g., pairs when N=2) while respecting any specified domain constraints. After receiving a model comprising the parameters and respective values to test, along with constraints in a form of logical predicates, the system and method produces the test cases. Based on the constraints, an algorithm removes invalid combinations in a first stage, and prevents any other invalid combinations from being used in a second stage during the test case generation process. A full set of statistically valuable test cases are thus efficiently and automatically generated, significantly improving testing while significantly reducing the resources needed to test.