The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Oct. 20, 2003
Brian L. Smith, Sunnyvale, CA (US);
Brian L. Smith, Sunnyvale, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A system for testing a synchronous link utilizing a single test pattern sequence. Components coupled via a link are each configured to generate and check test patterns according to a single repeated test pattern sequence. Test patterns which are generated are based upon two simple patterns. Each test cycle, a bit is chosen from one of the two patterns for use in generating the test pattern. A sixteen cycle test pattern sequence is utilized in which values are chosen from one or the other of the two patterns in a predetermined manner. In a bi-directional test, two components which are coupled via a link alternate driving selected values based upon the predetermined sequence. Each component may alternate driving sequences of one or more cycles. An ordering of cycles may be chosen to test various permutations of driver interaction between the respective components.