The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2007

Filed:

Oct. 08, 2002
Applicant:

Takeshi Onodera, Kanagawa, JP;

Inventor:

Takeshi Onodera, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scan path circuit having a plurality of scan chain circuits includes a data compression circuit for data-compressing the outputs of the scan chain circuits and delivering the compressed outputs, and a selection circuit for switching the inputs of the scan chain circuits. The selection circuit switches an operation mode selectively in accordance with a predetermined control signal in such a manner that, in a first operation mode, an input signal obtained from a predetermined input terminal is delivered to the first and second scan chain circuits, and in a second operation mode, the input signal is delivered to the first and third scan chain circuits. Accordingly, the logic circuit can be tested with certainty in a short required time by the simplified structure.


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