The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2007

Filed:

Jul. 15, 2002
Applicants:

Han C. Wen, San Jose, CA (US);

Tomas J. Pavel, San Jose, CA (US);

Inventors:

Han C. Wen, San Jose, CA (US);

Tomas J. Pavel, San Jose, CA (US);

Assignee:

Network Physics, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/10 (2006.01); G06F 13/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A moving window of data is used to determine a local baseline as a moving average of the data weighted by the number of measurements in each time interval. A next measurement associated with a next time interval is compared to a value associated with the baseline to determine an outlier. In some cases, for example where the time series of the data shows small variability around a local mean, the next measurement is compared to a multiple of the weighted moving average to determine an outlier. In other cases, for example where the time series of the data shows significant variability around the local mean, the next measurement is compared to the sum of the weighted moving average and a multiple of a moving root mean square deviation value weighted by the number of measurements in each time interval and in some cases, a damping factor.


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