The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Apr. 28, 2005
Bruce J. Whitefield, Camas, WA (US);
Paul J. Rudolph, West Linn, OR (US);
James N. Mcnames, Portland, OR (US);
Byungsool Moon, Beaverton, OR (US);
Bruce J. Whitefield, Camas, WA (US);
Paul J. Rudolph, West Linn, OR (US);
James N. McNames, Portland, OR (US);
Byungsool Moon, Beaverton, OR (US);
State of Oregon University Portland State, Portland, OR (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method for selecting test site locations on a substrate, by a) specifying a subset of all test site locations on the substrate, and b) selecting a desired number of candidate test site locations from within the subset of test site locations on the substrate. c) While selecting one of the candidate test site locations and holding all others of the candidate test site locations as fixed, determining a new location for the selected one of the candidate test site locations, which new location increases a test sensitivity, as estimated by a trace of a variance-covariance matrix. d) Repeating step (c) for each candidate test site location in the subset of test site locations, to produce a finalized set of candidate test site locations, until a desired end point is attained.