The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Jul. 30, 2004
Francis J. O'brien, Jr., Newport, RI (US);
Francis J. O'Brien, Jr., Newport, RI (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A multi-stage method is provided for automatically characterizing data sets containing data points which are each defined by measurements of three variables as either random or non-random. A three-dimensional Cartesian volume which is sized to contain all of a total number N of data points in the data set which is to be characterized. The Cartesian volume is partitioned into equal sized cubes, wherein each cube may or may not contain a data point. A predetermined route is defined that goes through every cube one time and scores each cube as a one or a zero thereby producing a stream of ones and zeros. The number of runs is counted and utilized to provide a Runs Test which predicts if the N data points in any data set are random or nonrandom. Additional tests are used in conjunction with the Runs Test to increase the accuracy of characterization of each data set as random or nonrandom.