The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2007

Filed:

May. 19, 2003
Applicants:

Kent Skarp, Borlange, SE;

Oleksandr Slobodyanyuk, Kiev, UA;

Sergiy Valyukh, Kiev, UA;

Inventors:

Kent Skarp, Borlange, SE;

Oleksandr Slobodyanyuk, Kiev, UA;

Sergiy Valyukh, Kiev, UA;

Assignees:

Swedish LCD Center, Borlange, SE;

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for simultaneous measuring a thickness of a liquid crystal layer and an average refractive index of the said liquid crystal in sealed liquid crystal cell is disclosed. The method is based on analysis of spectral positions of maxima and minima of interference oscillations, their magnitudes and their envelope in the spectrum of light mirrored by the liquid crystal cell at several different angles-of-incidence. The method is applicable to cells filled with different liquid crystals including cholesterics and smectics.


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