The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Jan. 13, 2005
Isaac Shpantzer, Bethesda, MD (US);
Jacob B. Khurgin, Baltimore, MD (US);
Pak Shing Cho, Gaithersburg, MD (US);
Yaakov Achiam, Rockville, MD (US);
Isaac Shpantzer, Bethesda, MD (US);
Jacob B. Khurgin, Baltimore, MD (US);
Pak Shing Cho, Gaithersburg, MD (US);
Yaakov Achiam, Rockville, MD (US);
Celight, Inc., Silver Spring, MD (US);
Abstract
A photo-thermal, interferometric spectroscopy system is disclosed that provides information about a chemical at a remote location. A first light source assembly is included that emits a first beam. The first beam has one or more wavelengths that interact with the chemical and change a refractive index of the chemical. A second light source produces a second beam. The second beam interacts with the chemical resulting in a third beam with a phase change that corresponds with the change of the refractive index of the chemical. A detector system is positioned remote from the chemical to receive at least a portion of the third beam. The detector system provides information on a phase change in the third beam relative to the second beam that is indicative of at least one of, absorption spectrum and concentration of the chemical.