The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Sep. 02, 2004
Emmanuel Fretel, Epinay sur Orge, FR;
Yves Danthez, La Norville, FR;
Catherine Wallerand, Massy, FR;
Arshad Mirza, Lewittown, PA (US);
Emmanuel Fretel, Epinay sur Orge, FR;
Yves Danthez, La Norville, FR;
Catherine Wallerand, Massy, FR;
Arshad Mirza, Lewittown, PA (US);
Jobin Yvon SAS, Longjumeau, FR;
Abstract
A device and a method for spectroscopic measurement of the spectrum of a light beam. The method includes detecting the dispersed light fluxes of the beam on an imaging device comprising a matrix of photodetectors with active columns, directing the imaging device so that one wavelength is allocated to a line of photodetectors, determining for each light flux the exposure time τnecessary to measure a maximal intensity Iand the sub-matrix Mof photodetectors associated with the light fluxes, allocating to the sub-matrix Mof photodetectors an exposure time τ'so that τ′is the largest integer divider of the total integration time T smaller than τ, measuring and resetting, during the integration time T of said spectrum, at each time τ′, the corresponding sub-matrix Mindependently of the other sub-matrices Mwith j≠i, and measuring the spectrum of the beam at the time T.