The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2007

Filed:

Oct. 07, 2001
Applicants:

Yair Alster, Tel Aviv, IL;

Omer Refaeli, Givatayim, IL;

Barak Azmon, Tel Aviv, IL;

Inventors:

Yair Alster, Tel Aviv, IL;

Omer Refaeli, Givatayim, IL;

Barak Azmon, Tel Aviv, IL;

Assignee:

Notal Vision Inc., Wilmington New Castle, DE (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for performing an eye test and for detecting eye disease. A test pattern is presented to an individual. The individual fixates an eye on a fixation target. The test pattern is then hidden and a second test pattern is displayed at a different location. The individual then compares the perceived second test pattern with a pre-defined reference pattern. These steps are repeated several times, while varying the location of presentation of the patterns. Alternatively, the individual fixates on a presented fixation target. A test pattern is presented to the patient and then disappears. The individual compares the perceived pattern, with a pre-defined reference pattern. These steps are repeated while changing the location of presentation of the test pattern. It may then be determined whether the individual has an eye disease based on the comparisons.


Find Patent Forward Citations

Loading…