The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Feb. 10, 2005
David L. Hicks, Fowlerville, MI (US);
Michael J. Niel, Redford, MI (US);
David L. Hicks, Fowlerville, MI (US);
Michael J. Niel, Redford, MI (US);
Toyota Technical Center USA, Inc., Ann Arbor, MI (US);
Abstract
An improved surface testing apparatus, such as a scratch test apparatus, allows accurate determination of the test speed, for example using one or more magnetic sensors. An example scratch test apparatus comprises an arm assembly, and an attached blade moving over the surface during the scratch test. A pair of spaced apart reed switches are provided proximate to the arm assembly, the reed switches being successively actuated by a magnetic portion of the arm asssembly as it moves during the scratch test.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile