The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
Aug. 11, 2005
Himanshu J. Verma, Mountain View, CA (US);
Himanshu J. Verma, Mountain View, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A method and apparatus for the utilization of on-chip, programmable resources to implement a signal distortion characterization circuit. Programmable logic resources, such as programmable delay lines and phase shifting circuits, are utilized to obtain estimates of, for example, capacitive coupling of signal energy between various signal and clock routes within a programmable logic device (PLD). Progressively delayed/advanced samples are taken of a test signal transmitted through a victim net to form baseline test data. Samples of the test signal are then repeated in the presence of test signals transmitted through aggressor net(s) and compared to the baseline results to measure crosstalk distortion caused by capacitively coupled energy from the aggressor nets onto the victim net.