The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2007

Filed:

Jul. 19, 2002
Applicants:

Amir Netz, Bellevue, WA (US);

Cristian Petculescu, Redmond, WA (US);

Mosha Pasumansky, Redmond, WA (US);

Richard R. Tkachuk, Sammamish, WA (US);

Alexander Berger, Sammamish, WA (US);

Inventors:

Amir Netz, Bellevue, WA (US);

Cristian Petculescu, Redmond, WA (US);

Mosha Pasumansky, Redmond, WA (US);

Richard R. Tkachuk, Sammamish, WA (US);

Alexander Berger, Sammamish, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for analytically modeling data organized according to non-referred attributes is disclosed. Data stored in a first and a second relational data table is analytically modeled in a data cube. The first table organizes a first type according to a first attribute. The second table organizes a second type according to the first attribute and a second attribute. A first measure is modeled according to the first type of the first table. A first dimension is modeled according to the first attribute of the first and second tables. A second dimension is modeled according to the second attribute of the second table. The first measure is tied to the first dimension according to the first attribute of the first table to allow the first measure to be analyzed by the first dimension according to the first attribute. The first measure is tied to the second dimension by, for each entry of the first dimension, allocating the entry to each entry of the second dimension in a predetermined manner.


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