The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2007

Filed:

Nov. 19, 2003
Applicants:

Charles Q. Zhan, Chandler, AZ (US);

Joseph Z LU, Glendale, AZ (US);

Inventors:

Charles Q. Zhan, Chandler, AZ (US);

Joseph Z Lu, Glendale, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus, and computer program are provided for identifying a defective valve. The method, apparatus, and computer program identify one or more indicators of a possible defect in the valve at a plurality of resolution levels. The one or more indicators are identified using at least one of one or more operating characteristics associated with the valve. The method, apparatus, and computer program generate a plurality of indexes associated with the resolution levels, where the indexes are based on the one or more indicators and identify a likelihood of a valve defect. The method, apparatus, and computer program select one of the plurality of resolution levels using at least one of the indexes. The method, apparatus, and computer program determine an overall probability of a valve defect using at least one index associated with the selected resolution level.


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