The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2007

Filed:

Nov. 13, 2003
Applicant:

Henry Nicponski, Albion, NY (US);

Inventor:

Henry Nicponski, Albion, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

In methods, systems, and computer program products for locating a regularly configured object within a digital image, a plurality of primary rotated integral images of the digital image are computed. Each primary rotated integral image has a different in-plane rotation. A set of secondary rotated integral images are derived from each of the primary rotated integral images. The secondary rotated integral images have further in-plane rotations relative to the respective primary rotated integral image. A window is defined within the digital image and corresponding windows of the rotated integral images. The values of convolution sums of a predetermined set of feature boxes within the window, in each of the rotated integral images are extracted. The dimensionality of the convolution sums is reduced to provide a set of reduced sums. A probability model is applied to the reduced sums to provide a best estimated derotated image of the window.


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