The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
Nov. 09, 2001
Atsusi Wada, Kyoto, JP;
Kouji Egawa, Kyoto, JP;
Atsusi Wada, Kyoto, JP;
Kouji Egawa, Kyoto, JP;
Arkray, Inc., Kyoto, JP;
Abstract
A linearizing correction unit () carries out a linearizing correction process on the output of an image sensor () based upon linearizing correction data stored in a linearizing correction data holding unit (), and a light-irregularity correction unit () carries out a light-irregularity correction process on the image sensor output that has been subjected to the linearizing correction process based upon light-irregularity correction data stored in a light-irregularity correction data holding unit (). A refection factor calculation unit () calculates an integral value of the in-plane reflection factor of a test piece by using the output that has been subjected to the linearizing correction and light-irregularity correction with respect to pixel outputs of the image sensor () obtained when the test piece having in-plane density irregularities is measured. A quantifying unit () applies calibration curve data of a calibration-curve-data holding unit () to the integrated reflection factor obtained by the reflection factor calculation unit so that a sample density of the test piece is calculated.