The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
May. 04, 2006
Theo Jay Powell, Dallas, TX (US);
Bryan D Sheffield, McKlnney, TX (US);
Rashmi Sachan, Karnataka, IN;
Theo Jay Powell, Dallas, TX (US);
Bryan D Sheffield, McKlnney, TX (US);
Rashmi Sachan, Karnataka, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A novel array fault testing for a TCAM system that includes a plurality of TCAM blocks that is organized into at least one rectangular array having rows each having a plurality of TCAM blocks, a group of TCAM cells and associated read/write bit lines connecting the group of TCAM cells to write driver and decoding block. The data decode bypass circuit of the TCAM cell provides a raw write feature to detect faults in a full suite of memory related tests. The debug input of the data debug bypass circuit of the TCAM cell when asserted in the test mode enables the TCAM cell to write raw, unencoded data into the array, and when deasserted in the test mode, enables the testing of the TCAM array. The resulting TCAM cell provides exhaustive fault testing thereby detecting and eliminating faults in TCAM.