The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
Oct. 14, 2004
John Phelps Sottery, Hamden, CT (US);
Jorge Hernan Jaramillo, Southbury, CT (US);
Patricia Alison Lafleur, Shrewsbury, PA (US);
John Phelps Sottery, Hamden, CT (US);
Jorge Hernan Jaramillo, Southbury, CT (US);
Patricia Alison LaFleur, Shrewsbury, PA (US);
The Procter & Gamble Company, Cincinnati, OH (US);
Innovative Measurement Solutions, Inc., Milford, CT (US);
Abstract
Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate and calibrating an electromagnetic measurement device are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. In addition, the apparatus captures electromagnetic waves that pass through an attenuating filter and reflect from one or more calibration standards. Digital data is determined from the captured electromagnetic waves. The digital data is used to recalibrate the apparatus.