The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
May. 16, 2005
Jean J. Dolne, Thousand Oaks, CA (US);
Harold B. Schall, Oak Park, CA (US);
Paul J. Menicucci, Albuquerque, NM (US);
Jean J. Dolne, Thousand Oaks, CA (US);
Harold B. Schall, Oak Park, CA (US);
Paul J. Menicucci, Albuquerque, NM (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system capable of determining wavefront characteristics, such as air induced wavefront aberrations, includes a field programmable gate array (FPGA) device executing a phase diversity algorithm. The FPGA device can be a stand-alone device or comprise multiple FPGAs. The device receives an 'in-focus' and an 'out-of-focus' image having a known optical difference from that of the “in-focus” image. The device then performs as many phase diversity algorithm iterations as desired to reach an expression for the wavefront aberrations induced on the collected image data. The resulting wavefront data may be used to produce an enhanced image of the original image data. Example applications include remote sensors and targeting systems, and both passive imaging and active projection systems that compensate for wavefront anomalies.