Semiconductor circuit, method of monitoring semiconductor-circuit performance, method of testing semiconductor circuit, equipment for testing semiconductor circuit, and program for testing semiconductor circuit

Abstract

A semiconductor circuit is disclosed, including a DLL circuit for supplying a desired signal-delay amount. The DLL circuit includes detecting means for detecting variations of a signal-delay amount, and delay-amount control means for generating a delay-amount control signal for controlling, depending on the variations of the signal-delay amount detected by the detecting means, the signal-delay amount of the DLL circuit. The semiconductor circuit further includes a part for monitoring circuit performance of the semiconductor circuit based on the delay-amount control signal.