The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
Sep. 09, 2002
Jonathan L. Coffman, Marlborough, MA (US);
Hong LU, Shrewsbury, MA (US);
Ernest J. Wodds, Iii, Upton, MA (US);
Jonathan L. Coffman, Marlborough, MA (US);
Hong Lu, Shrewsbury, MA (US);
Ernest J. Wodds, III, Upton, MA (US);
Pall Corporation, East Hills, NY (US);
Abstract
Device and method for processing samples are provided. A first multiwell plate is stacked atop a second multiwell plate. The first multiwell plate has x wells arranged in an array, each well is capable of receiving a sample and has an outlet. The second multiwell plate has y wells arranged in an array, each well being capable of receiving a separate sample. y>x. The outlets of the first multiwell plate register with inlets of a subset of wells of the second multiwell plate when the first plate is stacked atop the second plate. Also provided are a mechanism for aligning the plates and transfer indicia for tracking transfer of sample from the first to the second plate. A mechanism for sealing the first plate to the second plate is provided so that samples can be directly transferred between the plates without cross-contamination occurring in open wells of the second plate.