The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
May. 03, 2005
Robert D. Brink, Coopersburg, PA (US);
James Walter Hofmann, Jr., Lansdale, PA (US);
Max J. Olsen, Mertztown, PA (US);
Gary E. Schiessler, Allentown, PA (US);
Lane A. Smith, Easton, PA (US);
Robert D. Brink, Coopersburg, PA (US);
James Walter Hofmann, Jr., Lansdale, PA (US);
Max J. Olsen, Mertztown, PA (US);
Gary E. Schiessler, Allentown, PA (US);
Lane A. Smith, Easton, PA (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
Communications equipment can be tested using a test pattern that is modified compared to, and more exploitive than, a standard test pattern. Test patterns can be employed that have lengthened or shortened consecutive identical digit (CID) portions, or that have lengthened or shortened pseudo random bit sequence (PRBS) portions. In some cases, PRBS polynomials are not re-seeded after each CID. Further, different order polynomials can be employed for different applications. Exemplary applications can include test equipment and built-in self-test capability for integrated circuits.