The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Dec. 31, 2003
Tushar Udeshi, Plano, TX (US);
Eric Parker, Heath, TX (US);
Tushar Udeshi, Plano, TX (US);
Eric Parker, Heath, TX (US);
Zyvex Labs, LLC, Richardson, TX (US);
Abstract
A method of extracting isosurface data from hierarchical node data, including providing hierarchical node data representing an object, the hierarchical node data including a lowest hierarchy level having a plurality of leaf nodes and a plurality of higher hierarchy levels each having a plurality of non-leaf nodes each encompassing ones of the plurality of leaf nodes. The method also includes determining a plurality of leaf node splats each corresponding to one of the plurality of leaf nodes that includes a portion of an isosurface, wherein each of the plurality of leaf node splats is based on scalar data corresponding to at least one of the plurality of leaf nodes. A plurality of non-leaf node splats each corresponding to one of the plurality of non-leaf nodes that includes a portion of the isosurface is also determined, wherein each of the plurality of non-leaf node splats is based on a plurality of splats each corresponding to a lower hierarchical node.