The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Apr. 06, 2006
Applicant:
Kenneth Stern, Watertown, MA (US);
Inventor:
Kenneth Stern, Watertown, MA (US);
Assignee:
Analog Devices, Inc., Norwood, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); H03L 7/00 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for measuring the time delay between adjacent clock edges includes target and delay signal paths, a variable delay module in said delay signal path, the delay cell having a delay bias input, and a phase detector having respective inputs coupled to the target and delay signal paths. The variable delay module is operable to delay a first clock signal on the delay path so that a bias input signal presented to the delay bias input, when a bias input signal is present, corresponds to the time delay between the first clock signal and a second clock signal on the target signal path.