The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Feb. 15, 2005
Applicants:
Peter L. Delos, Mt. Laurel, NJ (US);
David B. Zaff, Maple Shade, NJ (US);
Matthew W. Smith, Cherry Hill, NJ (US);
Inventors:
Peter L. Delos, Mt. Laurel, NJ (US);
David B. Zaff, Maple Shade, NJ (US);
Matthew W. Smith, Cherry Hill, NJ (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); H03D 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for determining the phase characteristics of a nonlinear analog device includes application of a test signal, which may be linear-FM, to the nonlinear device. The converted signal is digitized and mathematically converted to baseband in ideal fashion. A digitized version of the original test signal and the downconverted signal are phase compared to determine the phase error.