The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Mar. 15, 2005
Applicants:

John M. Peterson, Jeffersonville, PA (US);

Steven A. Kunsman, Allentown, PA (US);

Mohamed Y Haj-maharsi, Raleigh, NC (US);

Reynaldo Nuqui, Cary, NC (US);

James Stoupis, Raleigh, NC (US);

Inventors:

John M. Peterson, Jeffersonville, PA (US);

Steven A. Kunsman, Allentown, PA (US);

Mohamed Y Haj-Maharsi, Raleigh, NC (US);

Reynaldo Nuqui, Cary, NC (US);

James Stoupis, Raleigh, NC (US);

Assignees:

ABB Technology AG, Zurich, CH;

ABB Research Ltd., Zurich, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A digital signal processor implementation of three algorithms used to detect high impedance faults. The algorithms can be wavelet based, higher order statistics based and neural network based. The algorithms are modified to process one second of data instead of ten seconds of data and a double buffered acquisition is connected to the output of the algorithms.


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