The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Dec. 11, 2002
Per Waaben Hansen, Lyngby, DK;
Per Waaben Hansen, Lyngby, DK;
Foss Analytical A/S, Hillerod, DK;
Abstract
The invention relates to measuring instruments, preferably of the kind measuring absorbances, in an object, of electromagnetic radiation in at least two spectral ranges, such as IR instruments, and DXR, meaning Dual X-ray instruments, and more specifically to the determination of properties of food or feed, such as the fat content in milk or meat. The invention relates in particular to a method of providing a correction for a slave instrument of the kind measuring properties of an object by exposing the object to electromagnetic radiation, in particular X-rays, in at least two spectral ranges and obtaining one or more object responses thereto. The responses obtained being preferably based on detecting attenuation and/or reflection and/or scatter of the electromagnetic radiation in/from the object by use of one or more detectors and are obtained in a form where they express properties of the object either directly or via a transformation.