The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
May. 24, 2005
Erwin Wenti Liang, Ballston Lake, NY (US);
Vinod Padmanabhan Kumar, Guilderland, NY (US);
Erwin Wenti Liang, Ballston Lake, NY (US);
Vinod Padmanabhan Kumar, Guilderland, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method of determining a tool geometry and tool orientation for any prescribed path along a workpiece of a cutting tool is described. A parameter set is provided, where parameters of the parameter set include tool geometry and tool orientation relative to a surface of the workpiece. Values of the parameters in the parameter set are determined such that no local interference or global interference occurs, where local interference occurs when a portion of the tool immediately adjacent a cutting edge of the tool contacts a sidewall of a groove already cut by the cutting edge, and global interference occurs when a portion of the tool away from the cutting edge contacts a sidewall of a groove already cut by the cutting edge.