The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Nov. 08, 2001
Matt Pearson, Ottawa, CA;
Lynden Erickson, Cumberland, CA;
John Miller, Ottawa, CA;
Siegfried Janz, Ottawa, CA;
Dan-xia Xu, Gloucester, CA;
Pavel Cheben, Ottawa, CA;
Andre Delage, Gloucester, CA;
Boris Lamontagne, Ottawa, CA;
Sylvain Charbonneau, Cumberland, CA;
Matt Pearson, Ottawa, CA;
Lynden Erickson, Cumberland, CA;
John Miller, Ottawa, CA;
Siegfried Janz, Ottawa, CA;
Dan-Xia Xu, Gloucester, CA;
Pavel Cheben, Ottawa, CA;
Andre Delage, Gloucester, CA;
Boris Lamontagne, Ottawa, CA;
Sylvain Charbonneau, Cumberland, CA;
Enablence Inc., Kanata, Ontario, CA;
Abstract
An optical performance monitor for measuring the performance of optical networks has an echelle grating for demultiplexing an input beam into a plurality of wavelengths that are focused onto an array of divided output waveguides. Each divided output waveguide is positioned to receive a corresponding demultiplexed wavelength from the echelle grating or other waveguide multiplexer device. The divided output waveguides laterally separate the corresponding demultiplexed wavelength into a first and second portions. A detector array is positioned to receive the respective portions of the demultiplexed wavelengths and by comparing their relative intensity it is possible to detect any drift in the nominal wavelengths of the channels.