The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Jul. 09, 2003
Suneel Tumkur Shankarappa, Bangalore, IN;
Gregory Alan Mohr, Scotia, NY (US);
Mysore Siddu Dinesh, Bangalore, IN;
Brian Walter Lasiuk, Niskayuna, NY (US);
Ronald Cecil Mcfarland, Cincinnati, OH (US);
Elizabeth Lokenberg Dixon, Delanson, NY (US);
Suneel Tumkur Shankarappa, Bangalore, IN;
Gregory Alan Mohr, Scotia, NY (US);
Mysore Siddu Dinesh, Bangalore, IN;
Brian Walter Lasiuk, Niskayuna, NY (US);
Ronald Cecil McFarland, Cincinnati, OH (US);
Elizabeth Lokenberg Dixon, Delanson, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A system and method for identifying flaws in a part being inspected includes generating a 3-d representation of the part, the 3-d representation comprising 3-d spatial coordinates corresponding to different locations on the part, and registering the 3-d spatial coordinates with corresponding locations of a part being inspected. An image of the part being inspected is generated, and a flaw in the part being inspected is identified from the generated image. A location of the flaw is correlated to a corresponding 3-d spatial coordinate, and a device is controlled to perform an operation on the part being inspected at the flaw location using information of the corresponding 3-d spatial coordinate.