The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Sep. 30, 2003
Burak Acar, Bebek, TR;
Christopher F. Beaulieu, Los Altos, CA (US);
Salih B. Gokturk, Mountain View, CA (US);
Carlo Tomasi, Palo Alto, CA (US);
David S. Paik, Palo Alto, CA (US);
R. Brooke Jeffrey, Jr., Los Altos Hills, CA (US);
Sandy A. Napel, Menlo Park, CA (US);
Burak Acar, Bebek, TR;
Christopher F. Beaulieu, Los Altos, CA (US);
Salih B. Gokturk, Mountain View, CA (US);
Carlo Tomasi, Palo Alto, CA (US);
David S. Paik, Palo Alto, CA (US);
R. Brooke Jeffrey, Jr., Los Altos Hills, CA (US);
Sandy A. Napel, Menlo Park, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A method to detect and classify a structure of interest in a medical image is provided to enable high specificity without sacrificing the sensitivity of detection. The method is based on representing changes in three-dimensional image data with a vector field, characterizing the topology of this vector field and using the characterized topology of the vector field for classification of a structure of interest. The method could be used as a stand-alone method or as a post-processing method to enhance and classify outputs of a high-sensitivity low-specificity method to eliminate false positives.