The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Sep. 21, 2004
Dimitri Victorovich Yatsenko, Salt Lake City, UT (US);
Richard Larry Anderton, West Jordan, UT (US);
Dimitri Victorovich Yatsenko, Salt Lake City, UT (US);
Richard Larry Anderton, West Jordan, UT (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
The present invention provides for an x-ray system and method using dynamic automated spatial modulation of an x-ray beam. The system includes an x-ray source transmitting a spatially modulated beam towards an object to be imaged, an x-ray detector receiving the beam and measuring a plurality of intensities across the beam, a beam processor controlling the beam intensity profile, and an image processor producing an output image signal. The detector produces a residual image based on at least the intensities measured at the detector. The beam intensity profile may be based on at least some of the following: (a) the residual image from the x-ray detector, (b) current beam intensities, (c) regions on interest in the image, and (d) predicted or measured object motion in the image. The system's output image is based on one or more of said residual image and said beam intensity signal.