The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Mar. 24, 2006
Richard Aufrichtig, Santa Clara, CA (US);
John Robert Lamberty, Waukesha, WI (US);
Paul Richard Granfors, Santa Clara, CA (US);
Richard Aufrichtig, Santa Clara, CA (US);
John Robert Lamberty, Waukesha, WI (US);
Paul Richard Granfors, Santa Clara, CA (US);
Other;
Abstract
Systems, processes and apparatus are described through which non-destructive imaging is achieved, including a process for variable binning of detector elements. The process includes accepting input data indicative of image quality goals and descriptors of an imaging task, as well as parameters characterizing a test subject, relative to non-destructive imaging of an internal portion of the test subject and determining when the non-destructive imaging system is capable of achieving the image quality goals using binning of more than four pixels.