The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Dec. 22, 2004
Georg Herbst, Goettingen, DE;
Heinz-guenther Ozimek, Katlenburg-Lindau, DE;
Ingo Fahlbusch, Goettingen, DE;
Heinz-hermann Henkel, Goettingen, DE;
Klaus-dieter Albrecht, Bovenden, DE;
Georg Herbst, Goettingen, DE;
Heinz-Guenther Ozimek, Katlenburg-Lindau, DE;
Ingo Fahlbusch, Goettingen, DE;
Heinz-Hermann Henkel, Goettingen, DE;
Klaus-Dieter Albrecht, Bovenden, DE;
Carl Zeiss Jena GmbH, Jena, DE;
Abstract
The invention is directed to a microscope objective with axially adjustable correction mounts and is applicable in connection with different cover slips and/or different immersion liquids and/or at different work temperatures. In the microscope objective according to the invention, helical springs which are uniformly distributed along the circumference and act in axial direction are fixed by a first ring which has pins in axial direction on which the helical springs are arranged. The pins engage in bore holes of a second ring. The bore holes are at least deep enough to ensure the required spring path. The two rings with the helical springs arranged therebetween on the pins form a spring retainer which ensures a movement of the parts without play and/or in a springing manner. In principle, the proposed solution can be substituted for all pressure springs in microscope objectives and other objectives and can overcome the disadvantages of using individual springs.