The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Jan. 18, 2007
Yoshimasa Suzuki, Kawasaki, JP;
Kayuri Muraki, Hachioji, JP;
Yoshimasa Suzuki, Kawasaki, JP;
Kayuri Muraki, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.