The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Sep. 21, 2004
Applicants:

Sebastian Tondorf, Waging am See, DE;

Walter Huber, Traunstein, DE;

Inventors:

Sebastian Tondorf, Waging am See, DE;

Walter Huber, Traunstein, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 11/02 (2006.01); G01N 21/86 (2006.01); G01V 8/00 (2006.01); G01D 5/34 (2006.01); G01D 5/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A position-measuring device includes: a measuring graduation provided on a material measure going around in ring-like fashion; a scanning unit for optically scanning the measuring graduation using electromagnetic radiation; a scanning plate with a periodic scanning graduation which is arranged in the beam path of the electromagnetic radiation used for scanning the measuring graduation, so that the radiation interacts both with the scanning graduation and with the measuring graduation; and a detector of the scanning unit, the detector surface of which is used for detecting the electromagnetic radiation after interaction with the scanning graduation and the measuring graduation and which is arranged with a period (P) for detecting electromagnetic radiation in the form of a stripe pattern. The period Pof the measuring graduation and the period Pof the scanning graduation may be coordinated so that 1/(1/P−1/P)<P.


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