The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Feb. 23, 2004
Applicants:
Jayesh Jasapara, Watchung, NJ (US);
Andrew D. Yablon, Livingston, NJ (US);
Inventors:
Jayesh Jasapara, Watchung, NJ (US);
Andrew D. Yablon, Livingston, NJ (US);
Assignee:
Fitel USA Corp, Norcross, GA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A fiber characterization arrangement utilizes Fourier domain optical coherence tomography (FDOCT) to measure the cross-section of optical fibers, thus providing information sub-surface features, coating thickness/concentricity and stress-induced birefringence under tension. The FDOCT technique can also be used to study microstructured fibers. By making FDOCT measurements on a fiber placed in a cavity, the geometric and optical thickness of the fiber can be simultaneously measured, allowing for the determination of the refractive index of the fiber.