The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Dec. 19, 2002
Applicants:

Sang-sun Shin, Kyongsangbuk-do, KR;

Ho-kyun Kim, Inchon-kwangyokshi, KR;

Inventors:

Sang-Sun Shin, Kyongsangbuk-do, KR;

Ho-Kyun Kim, Inchon-kwangyokshi, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and a method for testing a liquid crystal display panel are disclosed in the present invention, which enable to conveniently inspect a cutting plane of an individual unit liquid crystal panel. The apparatus includes a first memory unit storing a reference image of an end portion of a reference panel taken through a camera, a second memory unit storing an observed image of an end portion of a cut unit liquid crystal display panel taken through the camera, a comparison/computation unit computing a difference value by comparing the reference image and the observed image, and a display unit displaying the difference value of the comparison/computation unit.


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